Production of Transparent Heat Windows of TiO₂/Ag/TiO₂, and Investigation of their Nanostructures

Abstract:

Using the resistive heated method, TiO₂/Ag/TiO₂ thin files (Transparent heat windows) in vertical deposition angle were deposited on SiO₂ substrate, in high vacuum (HV) condition and 100°c. The thickness of TiO₂ on glass substrate was 50°A, Silver film 125°A and 225°A and the upper layer TiO₂ with 115°A. All other deposition conditions were same for both samples .Atomic force microscope (AFM), and spectrophotometric methods were used to study the nanostructures of these samples in the range of FTIR. The purpose of this work is to find and produce the structure with the least energy waste.

• Periodical: Applied Mechanics and Materials (Volumes 110-116)
• Pages: 3856-3859
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.110-116.3856
• Online since: October 2011
• Authors: Mohammad Reza Behforooz, Haleh Kangarloo
• Keywords: AFM, Component, HV Condition, Spectrophotometric, Transparent Heat Window

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