For Libraries For Publication Open Access Downloads About Us Contact Us
Paper Titles
Study of Transmittance of CdS Thin Films Prepared by Spray Pyrolysis
p.1011
Advances in Research on Left-Handed Met Materials
p.1016
Eutectic Growth Mode of Al-Si Alloy Solidified under High Pressure
p.1020
Additives Applied for Preparation of Superfine Mg(OH)2 Particles by Light-Burned MgO at Low Temperature
p.1026
Wrinkle Formation and Imprinting of Gold Film Deposited on Polydimethylsiloxane
p.1031
A Density Functional Study of Ho-Doped Sin (n=1-12, 16, and 18) Clusters
p.1035
Preparation and Research of AuNi Cathode Catalyst for Direct Methanol Fuel Cell
p.1039
Preparation of High Compression Strength Silicon Hybrid Material at Low Temperature through Sol-Gel
p.1044
Effect of Pore Size on the Hydrophilicity in Dark of TiO2 Films
p.1049

Wrinkle Formation and Imprinting of Gold Film Deposited on Polydimethylsiloxane

Article Preview

Abstract:

Bi-axial tensile stress was applied on a polydimethylsiloxane film and mounted on a PMMA plate surface. Then, the film’s tensile strain was fixed and the gold film was sputtered onto the surface. A wrinkle pattern was found during the release of tensile strain because of the friction effect between the PMMA plate and a polydimethylsiloxane film. A nickel stamp with a wrinkle structure fabricated using electroforming process and the polymeric wrinkle structure can be replicated successfully by electroforming and by imprinting process.

You might also be interested in these eBooks
Mechanical and Electronics Engineering III View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 130-134)

Pages:

1031-1034

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.130-134.1031

Citation:

Cite this paper

Online since:

October 2011

Authors:

Zue Chin Chang, C.B Lin, Jin Shin Ho, Wen Hua Yang

Keywords:

Imprinting, Poly(Dimethylsiloxane) (PDMS), Wrinkle

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

References

[1] Navez M, Sella C and Chaperot D, C.R. Acad. Sci., Paris, 1962, 254.

Google Scholar

[2] Byungnam Kahng, Jeenu Kim Current Applied Physics 2004, 4, 115.

Google Scholar

[3] Jurgen Reif, Florenta Costache, Matthias Henyk, Stanislav V., Pandelov. AppliedSurface Science, 2002, 197-198, 891.

Google Scholar

[4] Ned Bowden, Scott Brittain, Anthony G. Evans, John W. Hutchinson & George M. Whitesides. Nature 1998, 393, 146.

Google Scholar

[5] Ned Bowden, Wilhelm T. S. Huck, Kateri E. Paul, and George M. Whitesides. Applied Physics Letters, 1999, 75(17), 2557.

Google Scholar

[6] Wilhelm T. S. Huck, Ned Bowden, Patrick Onck, Thomas Pardoen, John W. Hutchinson, and George M. Whitesides. Langmuir. 2000, 16, 3497.

DOI: 10.1021/la991302l

Google Scholar

[7] A. L. VolynskII, S. Bazhenov, O. V. Lebedeva, N. F. Bakeev. Journal of materials science, 2000, 35, 547.

DOI: 10.1023/a:1004707906821

Google Scholar

[8] Frank Katzenberg. Nanotechnology, 2003, 14, 1019.

Google Scholar

© 2025 Trans Tech Publications Ltd. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For open access content, terms of the Creative Commons licensing CC-BY are applied.
Scientific.Net is a registered trademark of Trans Tech Publications Ltd.