Damage Efficiency Research of PCB Components under Strong Electromagnetic Pulse

Abstract:

To study damage effectiveness of strong electro-magnetic pulse to components of equipments, the power density in area of MOS circuit, diodes and transistor of a computer is simulated, using the method of the finite-difference time-domain (FDTD). Coupling laws in different areas are achieved, and then judging the damage efficiency of components. Electromagnetic pulse reflects constantly in computer box, causing power density appears oscillations. Energy gradually declines to zero, for it radiates outward from slots. Field concentration around PCB board results in dissociation of field strength, and slows down the attenuation of energy. Finally, formula of power density at random field strength and rise time is also obtained.

• Periodical: Applied Mechanics and Materials (Volumes 130-134)
• Pages: 1383-1386
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.130-134.1383
• Online since: October 2011
• Authors: Fei Xie, Bing Cao, Cheng Long Liu
• Keywords: Computer Box, Coupling, Damage Effectiveness, FDTD, Strong Electromagnetic Pulse

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DOI: 10.3788/hplpb20122411.2713