Study and Analysis a Powerful Debug Method for Smart Mobile Systems

Abstract:

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When dealing with such complex systems such as the software package of a smart mobile phone, it is necessary to apply powerful methods to detect and report errors when they occur. This paper probes and analyzes a powerful debug method called trap and exception handling, which is supported by the ARM platforms. The method can easily capture some valuable debug information. When a fatal error occurs during runtime or system detects an abnormal, a trap or an exception shall be logged and stored in the non-volatile random access memory (NVRAM). The information must be enough and easy for engineer to analyze the software error.

Info:

Periodical:

Edited by:

Han Zhao

Pages:

4270-4273

DOI:

10.4028/www.scientific.net/AMM.130-134.4270

Citation:

J. G. Yuan and S. Gu, "Study and Analysis a Powerful Debug Method for Smart Mobile Systems", Applied Mechanics and Materials, Vols. 130-134, pp. 4270-4273, 2012

Online since:

October 2011

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Price:

$35.00

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