The Study on Electronic Equipments Reliability Prediction Model

Abstract:

This paper mainly analyzes the two operating pressure changes have a major impact on electronic equipment reliability: temperature stress and humidity pressure. The average value of the products for the whole region failure rate of product use can forecast and speed up the test data and two functions: temperature and humidity probability distribution function and probability distribution function. Compared with the normal reliability prediction technology, the authors think that both sides of the area changes between pressure temperature stress and humidity the entire product business scope for more accurate prediction.

• Periodical: Applied Mechanics and Materials (Volumes 152-154)
• Pages: 1885-1890
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.152-154.1885
• Online since: January 2012
• Authors: Zhi Xue Liu
• Keywords: Accelerated Test, Electronic Equipment, Reliability Prediction Model

References

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DOI: 10.1109/rams.2003.1182042

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DOI: 10.3403/30077693u

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