Research on Integrated Diagnosis of Contact and Non-Contact Method for Analog Circuit

Abstract:

Traditional analog diagnoses by contact way generally get voltage, current or frequency response as their inputs. They have some inevitable drawbacks, such as the change of inputs during contacting and the inaccessibility of some necessary notes. Furthermore, contact method rarely does well in multi-faults. It can get high fault resolution or fault coverage only by high complexity of algorithm. This paper proposes a method of Integrated Diagnosis to solve the problems above. This method acquires raw data from both contact and non-contact way. It gets feature extraction and draws conclusions from the two ways respectively, and then fuses the two conclusions into a final decision. This method makes good use of information from multi-sensors. It obtains the advantages of both contact and non-contact way, but avoids the disadvantages of the two. Experiment shows its fault coverage and fault resolution both get an improvement, compared with that of other single methods. At the same time, it diagnoses multi-faults as simple and efficient as single-faults.

• Periodical: Applied Mechanics and Materials (Volumes 226-228)
• Pages: 1899-1905
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.226-228.1899
• Online since: November 2012
• Authors: Yan Hong Hao, Jia Li Wang
• Keywords: Analog Circuit, Data Fusion, Integrated Diagnosis, Non-Contact Method

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