Design of Double Delta-Doped Al0.22Ga0.78As/In0.22Ga 0.78As Pseudomorphic HEMTs

Article Preview

Abstract:

In this study, performances of double delta-doped AlGaAs/InGaAspseudomorphic high electron mobility transistors are investigated. Simulation results demonstrate good performance for this structure. Form simulation, the structure demonstrates a maximum current gain cutoff frequency of 145GHz for 100nm gate length, a peak extrinsic transconductance of 526mS/mm, and a maximum saturation current density of 350mA/mm.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

2007-2009

Citation:

Online since:

November 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] P.M. Smith, P.C. Chao, L.F. Lester R.P. Smith, B.R. Lee, D.W. Ferguson, A.A. Jabra, J.M. Ballingal and K.H.G. Duh, InGaAsPseudomorphic HEMTs forMillimeter Wave Power Applications, IEEEMicrowave Theory and Techniques Digest, (1988).

DOI: 10.1109/mwsym.1988.22183

Google Scholar

[2] F. Diette, D. Langrez, J. L Codron, E. Delos, D. Theron and G. Salmer, 1510mS/mm 0. 1μm gate lengthpseudomorphic HEMTs with intrinsiccurrent gain cutoff frequency of 220GHz, ElectronicLetters, Vol. 32, No. 9, pp.848-849, (1996).

DOI: 10.1049/el:19960516

Google Scholar

[3] Ki WookKim, Hong Tian and Michael A. Littlejohn, Analysis of Delta-Doped and Uniformly-Doped AlGaAs/GaAs HEMTsby Ensemble Monte Carlo Simulations, IEEE Transactions on Electron Devices, vol. 38, no. 8, pp.1737-1742, (1991).

DOI: 10.1109/16.119008

Google Scholar

[4] Yuji Awano, Makoto Kosugi, KinjiroKosemura, Takashi Mimura and MasayukiAbe, Short-Channel Effects in Subquarter-HEMT with Micrometer-Gate HEMTs: Simulation andExperiment, IEEE Transactions on Electron Devices, vol. 36, no. 10, pp.2260-2266, (1989).

DOI: 10.1109/16.40908

Google Scholar

[5] R. Stenzel, J. Hontschel and W. Klix, Simulation of ultra-short channel HEMTs with different gate concepts by 2D/3D hydrodynamics models, Proc. of 14thWorkshop on Modelling and Simulation of Electron Devices, Barcelona, Spain, October 16-17 (2003).

Google Scholar