Design and Implementation of an Integrated Electrical Equipment Testing System for a Certain Air Defense Weapon System

Article Preview

Abstract:

With a higher level of the information techonology application in weapon system, the comprehensive electric system becomes more and more complicated, bringing about higher requirements on equipment support. In this paper, the research is mainly targeted at the integrated electrical system for a certain air defense weapon system. The offline live testing plan is employed, and simulated field simulation technology, switch topology in different forms are intergrated throughout the research to complete the performance testing on the major electrical equipment, so as to test the equipment integrity. Research and development of the testing system provide a feasible design method and means of implementation for the performance testing and trouble diagonosis for electrical equipment of the new equipment.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

19-26

Citation:

Online since:

December 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Zhengchun Liu, Xia Zhao, Yong Wang, Integrated Electrical Equipment Fault Diagonosis Expert System Design Method For A Certain Air Defense Weapon System [J]. Firepower, Command and Control, 2011, 36 (6): 158-160. (In Chinese).

Google Scholar

[2] Yongteng Zhang, Deqing Guo, Donggen Chen, AA Gun Servo System and Whole Gun Control Electric Equipment [M]. Beijing: National Defense Industry Press, 2008. (In Chinese).

Google Scholar

[3] Minghong Chen, Wenhong Li, Liqiang Zhao, Automatic Testing System Research Based on Database and Virtual Instrument Technology [J]. Mechanical & Electrical Development and Innovation, 2010, 23(1): 94-96.(In Chinese).

Google Scholar

[4] Zheng Wang, Jianhua Song, Zhi Qiu. Design and Implementation of Aviation Electric Control Box Testing System Based on Virtual Instrument [J]. Computer Test Technology, 2011, 31(2): 17-20.(In Chinese).

Google Scholar