A New 10T SRAM Cell with Improved Read/Write Margin and No Half Select Disturb for Bit-Interleaving Architecture

Abstract:

A new 10T SRAM cell is proposed in this paper for simultaneously addressing the half select problem and improving the read/write stability. Without the half select condition, the proposed 10T cell allows efficient bit-interleaving to provide soft error rate protection and the dynamic power is also decreased significantly due to the reduction in the number of bitlines discharged and charged during the read and write operation. In the new 10T SRAM cell, one side of the cross-coupled inverters cuts off the pull up path or pull down path through adding two gated transistors according to the write ‘0’ or ‘1’ operation. It brings a great improvement for write stability without considering the half select disturb during the write operation. The simulation results indicate that the RSNM and WM of the proposed SRAM cell are enhanced by 130% and 58%, respectively, as compared to the conventional 6T SRAM cell in SMIC 65nm CMOS technology.

• Periodical: Applied Mechanics and Materials (Volumes 263-266)
• Pages: 9-14
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.263-266.9
• Online since: December 2012
• Authors: Hong Gang Zhou, Qiang Song, Chun Yu Peng, Shou Biao Tan
• Keywords: Bit-Interleaving, Half Select Problem, Write Stability

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