Effects on Morphology Change on the Mg-Doped Zinc-Oxide Surface Measured by Changing the AFM Feedback Speed

Zhe Fan; Dong Qing Yuan; Xiao Ping Ma; Yan Huang; Zhen Zhou

doi:10.4028/www.scientific.net/AMM.275-277.2357

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 275-277Effects on Morphology Change on the Mg-Doped...

Effects on Morphology Change on the Mg-Doped Zinc-Oxide Surface Measured by Changing the AFM Feedback Speed

Abstract:

Use Atomic Force Microscope to analyze surface morphology of the laboratory prepared Mg-doped zinc oxide films and standard gratings. Main measuring method is the use of semi-contact mode of the Atomic Force Microscope (tapping mode). When parameters such as frequencies and gains do not change, we focus on the differences of the results under different feedback speed (FB) working on the specimens, and sum up the relations between the feedback speed (FB) and the definition of the surface morphology of the specimens.

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Periodical:

Applied Mechanics and Materials (Volumes 275-277)

Pages:

2357-2362

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.275-277.2357

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Online since:

January 2013

Authors:

Zhe Fan, Dong Qing Yuan, Xiao Ping Ma, Yan Huang, Zhen Zhou

Keywords:

Atomic Force Microscope (AFM), Feedback Speed, Resonance, Semi-Contact Mode

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