Robust Design Analysis on Fatigue Life of Lead-Free Sn0.5Ag Solder in a Multichip Module Package

Abstract:

System-in-package (SiP) has become a mainstream technology in IC package industry as it provides the solutions to the growing needs of high speed functions, mobility/portability, energy efficiency, and miniaturization of electronic products. One special form of SiP is the multi-chip module (MCM) in which multiple integrated circuits (ICs), semiconductor dies or other discrete components are packaged onto a unifying substrate. Thus, the reliability of package integrity becomes one of the major reliability concerns. In the present paper, a robust design analysis on the thermo-mechanical reliability of an MCM package with flip-chip technology is demonstrated. Our results show that for the specific package, the CTE of the substrate is the most influential factor to the fatigue reliability of the package. The optimal combination of the parameters is recommended. The robust design analysis optimizes the fatigue life from 165 cycles to 1080 cycles which is a 554.5% gain on the fatigue life.

• Periodical: Applied Mechanics and Materials (Volumes 284-287)
• Pages: 375-379
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.284-287.375
• Online since: January 2013
• Authors: Chieh Kung
• Keywords: Finite Element Analysis (FEA), Lead-Free, Multichip Module Package, Taguchi Robust Method

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