Simulation Test System of CCD Signal Processor Based on FPGA

Da Zhang; Dong Bin Liu

doi:10.4028/www.scientific.net/AMM.300-301.698

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 300-301Simulation Test System of CCD Signal Processor...

Simulation Test System of CCD Signal Processor Based on FPGA

Abstract:

Simulation test system of CCD signal processor based on FPGA is proposed. Field-programmable gate array (FPGA) is applied as control processing core and used in the aerospace upgrade screening of industrial grade signal processor. The system functional composition and working principle were introduced in detail. Actually evaluation and testing system was completed with integrating the forty signal processor in a single board. The system has been successfully applied in the dynamic build-in screening test of industrial grade signal processor XRD98L63, the system work stably and reliability. Test result is zero on the nonconforming product rate, satisfying the qualification that single batch screening nonconforming rate is less than 5%, build-in screening of industrial grade components for the space load applications is implemented.

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Periodical:

Applied Mechanics and Materials (Volumes 300-301)

Pages:

698-702

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.300-301.698

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Online since:

February 2013

Authors:

Da Zhang, Dong Bin Liu

Keywords:

Build-in Screening, Field-Programmable Gate Array (FPGA), Signal Processor

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References

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