Observation on Non-Conductive Powder Samples by Scanning Electron Microscope

Abstract:

Different fixation methods have significant influence on observation of samples by scanning electron microscopy when non conductive samples are processed by plasma spudtter coating method. Non conductive powder samples using different treatments are observed on Philips XL30 scanning electron microscope and Hitachi S-4800 field emission scanning electron microscope. For the small size samples processed by two fixation methods, Sample shape were observed more clearly by the ultrasonic dispersion preparation on scanning electron microscope and had less interference of ion sputtering thermal effect. The effect is not obvious for the large size samples, and the effect of observation for non conducting samples is better on field emission scanning electron microscope at low accelerating voltage.

• Periodical: Applied Mechanics and Materials (Volume 320)
• Pages: 226-229
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.320.226
• Online since: May 2013
• Authors: Yuan Hui Ma, Xing Hua Zhang, Xue Guang Chen
• Keywords: Direct Dispersion Method, Sample Preparation, Scanning Electron Microscope (SEM), Ultrasonic Dispersion Method

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