Progress on the Numerical Calculation of Electrical Characteristics of Strained SiGe Channel P-MOSFET

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Recent progress in the computer simulation of strained SiGe channel p-MOSFET performance is reviewed. The electrical characteristics of strained SiGe channel p-MOSFET, such as threshold voltage, subthreshold characteristics, output characteristics, transconductance, quasistatic C-V characteristics and transfer characteristics, and the effects of Ge mole fraction on electrical characteristics, are well discussed. Finally, the development of strained SiGe channel p-MOSFET is prospected.

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465-472

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May 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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