Failure Rate Evaluation of Sensitive Equipment Caused by Voltage Sag

Article Preview

Abstract:

In order to accurately evaluate sensitive equipment failure rate caused by voltage sag, the concept of credibility measure is introduced to measure the uncertainty of equipment failure event. This evaluation measure can avoid the deficiencies containing in classical probability measure which needs a large number of testing samples. The uncertainty of failure event is presented by a fuzzy measure where the membership function of equipment voltage tolerance curve corresponding to the characteristic quantities in the uncertain area was determined by fuzzy statistical and a polynomial fit method. Then the credibility distribution function was determined. The proposed evaluation model of sensitive equipment failure rate caused by voltage sag is developed. Using the practical testing samples, the personal computer (PC) was evaluated by the proposed method. Comparing the proposed method with current methods, the results have shown that the proposed method is proper, correct and credible. This method may be more practicable in practical condition.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

1434-1438

Citation:

Online since:

June 2013

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Chen J Y, Milanovic J V, in: Methodology for assessment of financial losses due to voltage sags and short interruptions. 9th International Conference on Electrical Power Quality and Utilisation, Barcelona(2007).

DOI: 10.1109/epqu.2007.4424119

Google Scholar

[2] Milanovic J V, Gupta C P, in: Probabilistic assessment of financial losses due to interruptions and voltage sags-part Ⅰ: the methodology. IEEE Transactions on Power Delivery, Vol. 21-2(2006), pp.918-924.

DOI: 10.1109/tpwrd.2006.870988

Google Scholar

[3] Milanovic J V, Gupta C P, in: Probabilistic assessment of financial losses due to interruptions and voltage sags-part :practical implementation. IEEE Transactions on Power Delivery, Vol.21-2(2006), pp.925-932.

DOI: 10.1109/tpwrd.2006.870987

Google Scholar

[4] Djokic S Z, Desmet J, Vanalrne G,et al, in: Sensitivity of personal computers to voltage sags and short interruptions.IEEE Transactions on Power Delivery, Vol.20-1(2005), pp.375-383.

DOI: 10.1109/tpwrd.2004.837828

Google Scholar

[5] Gupta C P, Milanovic J V, in: Probabilistic assessment of equipment trips due to voltage sags. IEEE Transactions on Power Delivery, Vol.21-2(2006), pp.711-718.

DOI: 10.1109/tpwrd.2005.855447

Google Scholar

[6] Lu C N,Shen C C, in: Estimation of Sensitivity Equipment Disruption Due to Voltage Sags. IEEE Transactions on Power Delivery, Vol.22-2(2007), pp.1132-1137

DOI: 10.1109/tpwrd.2007.893433

Google Scholar

[7] LI W, Gui XM, Xiao X Y, in: Non-additive measure and assessment method of the failure possibility of sensitive equipment due to voltage sag. Power System Protection and Control, Vol.38-19(2010), pp.96-101(in Chinese)

Google Scholar

[8] Liu B D, Peng J, in: A Course in Uncertainty Theory. Bejing: Tsinghua University Press, pp.74-78(2005)(in Chinese).

Google Scholar