Subwavelength Defect Characterization Using Guided Wave Scattering Matrix

Yang Zheng; Jin Jie Zhou; Hui Zheng

doi:10.4028/www.scientific.net/AMM.330.504

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 330Subwavelength Defect Characterization Using Guided...

Subwavelength Defect Characterization Using Guided Wave Scattering Matrix

Abstract:

Although many imaging algorithms such as ellipse and hyperbola algorithm can roughly locate defects in large plate-like structures with sparse guided wave arrays, quantitative characterization of them is still a challenging problem, especially for those small defects known as subwavelength defects. Scattering signals of defects contain abundant information so that can be used to evaluate defects. A defects recognition method using the S-matrix (scattering matrix) was presented. S-matrices of hole and crack with S₀ mode incident were experimentally measured. The results show that defects can be recognized from the morphology of 2D S-matrix chart. This method has great potential to achieve more specific parameters of small defects with sparse guided wave arrays.

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Periodical:

Applied Mechanics and Materials (Volume 330)

Pages:

504-509

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.330.504

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Online since:

June 2013

Authors:

Yang Zheng, Jin Jie Zhou, Hui Zheng

Keywords:

Defect Recognition, Guided Wave, Quantitative Measurement, Scattering Matrix, Sparse Arrays

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