[1]
H. Miyajima, E. Yamamoto and K. Yanagisawa. Optical Micro Encoder with Sub-micron Resolution using a VCSEL, Sensors and Actuators , vol. A71, pp.213-218, (1998).
DOI: 10.1016/s0924-4247(98)00188-5
Google Scholar
[2]
C. Prelle, F. Lamarque and P. Revel, Reflective Optical Sensor for Long-range and High-resolution Displacements, Sensors and Actuators, vol. 127. 2006, pp.139-146, (2006).
DOI: 10.1016/j.sna.2005.11.005
Google Scholar
[3]
K. Zhang, C. Butler, Q, Yang and Y. Lu, A Fibre Optic Sensor for the Measurement of Surface Roughness and Displacement using Artificial Neural Networks, IEEE Instrumentation and Measurement Technology Conference, Brussels, Belgium, vol. 46, June 1996, pp.917-920.
DOI: 10.1109/imtc.1996.507301
Google Scholar
[4]
P. Gunther, T. Pfister and J. Czarske, Non-incremental Interferometric Displacement Measurement using a Laser Doppler Sensor with Phase Coding, Optics and Lasers in Engineering, vol. 49, p.1190–1193, (2011).
DOI: 10.1016/j.optlaseng.2011.05.001
Google Scholar
[5]
F. Jin, J. B. Khurgin, C. Wang, S. Trivedi, Y. Gabay, E. Gad, D. A. Temple and U. H. Hommerich, Displacement Measurement that Uses Transient Photoelectromotive Force Effects in CdTe: V with Frequency-modulated Lasers, Applied Optics, vol. 39, pp.3138-3142, (2000).
DOI: 10.1364/ao.39.003138
Google Scholar
[6]
G. Fu and A. G. Moosa, An Optical Approach to Structural Displacement Measurement and Its Application, Journal of Engineering Mechanics, vol. 128, p.511–520, (2002).
DOI: 10.1061/(asce)0733-9399(2002)128:5(511)
Google Scholar
[7]
C. Prelle, F. Lamarque and P. Revel, Reflective Optical Sensor for Long-range and High-resolution Displacements, Sensors and Actuators, vol. 127, p.139–146, (2006).
DOI: 10.1016/j.sna.2005.11.005
Google Scholar
[8]
S. Kuo, C. Hung, C. Lin and W. Yang, Development of a Nano-displacement Measurement System, Measurement, vol. 40, p.255–263, (2007).
DOI: 10.1016/j.measurement.2006.06.002
Google Scholar
[9]
Q. Jiang, H. Feng, D. Ouyang and M. T. Desta, A Roundness Evaluation Algorithm with Reduced Fitting Uncertainty of CMM Measurement Data, Journal of Manufacturing Systems, Vol. 25, pp.184-195, (2006).
DOI: 10.1016/s0278-6125(08)00005-8
Google Scholar