Micro-Ohm Resistance Measure System Based on LabVIEW

Tian Tian; Xu Min Zhao; Li Na Zeng; Yu Tao

doi:10.4028/www.scientific.net/AMM.347-350.111

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 347-350Micro-Ohm Resistance Measure System Based on...

Micro-Ohm Resistance Measure System Based on LabVIEW

Abstract:

According to the critical issue of accurate measurement of small resistance in the field of electronic measurement, the micro-ohm resistance measurement system is designed based on LabVIEW. It consists of two parts: hardware and software. The hardware is composed of AC constant current source, reference signal source, low noise amplifier, data acquisition card, computer etc.; The software consists of man-machine interface program, measure and control program and data processing program. The system based on virtual instrument cross-correlation detection technology achieves the effective measurement of micro-ohm resistance. It is an automatic measuring system with a flexible and convenient programming, simple and accurate measurement, high resolution and stable performance.