Test Method for Electronic Device on Condition of Small Sampling

Abstract:

The traditional quality testing method does not apply for the new electronic device which have characters that high-value and small-count, take advantage of the small sampling theory, we can reduce the number of test sample significantly by using the Bayes method. In the processing of the experimental data, we can improve the accuracy of the quality assessment of electronic devices by using of the Bayes method and make full use the prior information.

• Periodical: Applied Mechanics and Materials (Volumes 347-350)
• Pages: 525-528
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.347-350.525
• Online since: August 2013
• Authors: Ze Cheng, Zhao Long Xuan, Wei Wang, Mao Sen Hao
• Keywords: Electronic Device, Priori Information, Small Sampling, Zero-Failure Data

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