The Improved Design of Test Machine Linear-Velocity Closed-Loop Control Circuit

Chang Hai Li; Yuan Tao Yu; Shi Yang Ma; Yan Chun Liu

doi:10.4028/www.scientific.net/AMM.365-366.874

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 365-366The Improved Design of Test Machine...

The Improved Design of Test Machine Linear-Velocity Closed-Loop Control Circuit

Abstract:

Incremental PID has its shortcomings: great integral truncation effect, static error and spillover affect. In the control system, the controller system is required having a quick response speed, and also a certain anti-interference ability. When adopting the improved differential PID control algorithm, only the output differential is made, instead of the given values. So, when a given value changes, the output will not change, and the controlled quantity change is usually mild, in which case the control accuracy is improved, and the system dynamic characteristics is greatly improved.

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Periodical:

Applied Mechanics and Materials (Volumes 365-366)

Pages:

874-877

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.365-366.874

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Online since:

August 2013

Authors:

Chang Hai Li, Yuan Tao Yu, Shi Yang Ma, Yan Chun Liu

Keywords:

Conventional Digital PID, Improved Pid

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