An Intelligent Test Paper Generation Algorithm Based on Adjustment of Overall Difficulty Degrees

Abstract:

Intelligent test paper generation is an important factor for online examination systems, which determines whether the system can be used to effectively test the true levels of the testees. For the current algorithms of test paper generation that is low success rate, long time-consuming and the generated exam papers are difficult to meet actual demands, an intelligent algorithm of test paper generation is presented, that is based on adjusting of overall difficulty degrees of the test questions. According to the levels of difficulty degrees and the number of each type of questions required by the users, an appropriate number of questions for each level of the difficulty degree for the test paper is generated by the algorithm. Then, the corresponding questions are extracted randomly. Simulation results show that the intelligent test paper generation algorithm is faster, of good quality, the generated test papers can meet the actual demands.

• Periodical: Applied Mechanics and Materials (Volumes 411-414)
• Pages: 2879-2882
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.411-414.2879
• Online since: September 2013
• Authors: Gui Ying Han, Xi Zuo Li
• Keywords: Difficulty Degree, Divide and Conquer, Examination System, Test Paper Generation Algorithm

References

[1] J. Lu, The Research of Intelligent Test Paper Auto-Generation Based on An Improved Generic Algorithm, in 2007 Master Thesis of Central South University(In Chinese).

[2] C.A. Liu, T.X. Zhao, Y. Liu: Journal of Science Technology and Engineering, vol. 10, No. 30(2010). pp.7454-7456(In Chinese).

[3] B.L. Huang: Journal of Computer Simulation, Vol. 28 No. 5(2011), pp.380-383(In Chinese).

[4] Y.J. Wang, Y.Y. Huang: Journal of Computer Applications and Software, Vol. 21, No. 8(2004), pp.111-113(In Chinese).

[5] Y. Luo: Journal of Wuhan University of Technology, Vol. 31 No. 10(2009), pp.154-156.

[6] P.G. Lin, X.Z. Fan, Z.T. Yu, H.Y. Kan: Journal of Computer Engineering and Applications, 2006. 05, pp.165-167(In Chinese).