Effect of Laser Fluence on the Growth of Mo Films Prepared by a Pulsed Laser Deposition Method

Article Preview

Abstract:

Molybdenum films with flat and smooth surfaces were prepared on Si (100) substrates using a pulsed laser deposition method. results indicate that increased laser fluence results in narrower diffraction peak, higher surface roughness, and transition from amorphous state into polycrystalline state with gradually increased grain size. The growth mechanism of the films and the effects of particle energy on the growth of the films are discussed based on an analysis of the changes in the crystallization process with laser fluence.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

780-783

Citation:

Online since:

September 2013

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2013 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Walker A B C, Lindblom J, Barbee T W, et al. Soft X-ray images of the solar corona with a normal-incidence cassegrain multilayer telescope [J]. Science, 241 (1988) 1781-1787.

DOI: 10.1126/science.241.4874.1781

Google Scholar

[2] Shealy D L , Hoover R B, Walker A B C. Development of a normal incidence multilayer, imaging x-ray microscope[J]. SPIE, 1160 (1989) 109-113.

DOI: 10.1117/12.962633

Google Scholar

[3] Ceglio N M, Gaines D, Trebes J, et al. Time-resolved measurement of double-pass amplification of sofr x rays [J]. Appl. Opt, 27 (1988) 5022-5028.

DOI: 10.1364/ao.27.005022

Google Scholar

[4] Kinoshito H, et al. Soft x-ray reduction lithography using multilayer mirrors [J]. J. Vac. Sci. Tech, B7(6) (1989) 1648-1651.

Google Scholar

[5] Qi Hongji, Yi Kui, He Hongbo, et al. The effect of sputtering particle energy on surface characteristics of Mo thin films[J]. Acta Physica Sinica, 53(12) (2004) 4398-4404 (in Chinese).

DOI: 10.7498/aps.53.4398

Google Scholar

[6] Qin Junling, Yi Kui, Shao Jianda. Influence of sputtering energy of Mo atoms on microstructure of Mo/Si thin film[J]. Journal of Functional Materials and Devices, 92 (2002) 1216-1220.

Google Scholar

[7] Montcalm C, Grabner R F, Hudyma R M, et al. Multilayer coating of 10X projection optics[J] SPIE, 3676 (1999) 710-715.

Google Scholar

[8] Wang Zhanshan, Gao Honggang, Ma Yueying, et al. Soft x-ray multilayers[J]. Atomic Energy Science and Technology, 33(4) (1999) 337-339 (in Chinese).

Google Scholar

[9] Xue Yuzhi, Lin Jining, Verhoeven J. The research of soft x-ray optics multilayers[J]. Vacuum Science and Technology, 325 (2003) 272-275.

Google Scholar

[10] Qin Junling, Shao Jianda, Yi Kui, et al. Interface roughness of Mo/Si soft x-ray multilayers[J]. High Power Laser and Particle Beams, 308 (2007) 382-386.

Google Scholar

[11] Weaver I, Lewis C L S, MacPhee A G., et al. PLD fabrication of a soft X-ray multilayer mirror and LPP reflectance test [J]. Applied Surface Science, 127-129 (1998) 915-921.

DOI: 10.1016/s0169-4332(97)00766-6

Google Scholar

[12] Chen Tonglai, Li Xiaomin, Zhang Xia, et al. Pused laser deposition of MgO films and its crystallinity[J]. Journal of Inorganic Materials, 169-170 (2001) 560-563.

Google Scholar

[13] Wu Weidong, Xu Hua, Wei Sheng, et al. Pulse laser vapor deposition technology and its application in fabrication of the ICF film-targets[J]. High Power Laser and Particle Beams. 14(6) (2002) 873-876 (in Chinese).

Google Scholar

[14] Xue Zengquan, Wu Quande, Li Jie. Thin Film Physics [M]. Beijing: Electronical Industry Press, 215(1-3) (2003) 93-97.

Google Scholar

[15] Wei Helin, Liu Zuli, Yao Kailun, et al. Monte-Carlo simulation of thin film growth process[J]. Acta Physica Sinica, 169-170 (2003) 517-520.

DOI: 10.1016/s0042-207x(98)00328-5

Google Scholar

[16] Chen Min, Wei Helin, Liu Zuli, et al. Effect of low-energy deposition particles on initial stage of thin film[J]. Acta Physica Sinica, 50 (12) (2001) 2446-2451 (in Chinese).

Google Scholar