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The Design and Validation of DFT System for Mixed-Signal Circuits Based on JTAG

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Abstract:

Nowadays with the increases of the density of large scale integrated circuits, researches of Design for Test (DFT) become more and more important, JTAG (JTAG: Joint Test Action Group, also called Boundary Scan ) has been widely used in test area , which improves the testability and reliability of mixed-signal circuits. This paper puts forward a scheme to design a Built-in Test System (BITS) based on boundary scan technology. The BITS is realized in a weapon electronic control system, which is composed of mixed-signal circuits including ARM, AD/DA, FPGA, etc. With this method, several test experiments are carried out in the BITS, which include infrastructure integrity test, interconnect test, cluster test, AD/DA test and so on. The results of experiments show that the Built-in Test System based on JTAG can work normally, which is able to reduce effectively the complexity and the time of test. In a word, the capability of BITS is viable and the system is a virtual tool in the process of DFT design and application.

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Periodical:

Applied Mechanics and Materials (Volumes 427-429)

Pages:

636-639

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.427-429.636

Citation:

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Online since:

September 2013

Authors:

Guo Gang Liao*, Jun Li

Keywords:

DFT, Fault Detection, JTAG, Mixed-Signal Circuits

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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