Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit

Jing Yang; Cheng Lin Yang; Zhen Liu

doi:10.4028/www.scientific.net/AMM.444-445.1158

Paper Titles

Study on the Finite Element Strain Simulation Model Updating Method Based on the Real Measurement Data
p.1132

Study of Permanent Thermal Insulation for Arch Dam in Cold Region
p.1140

Numerical Simulation on the Overturn Process of Towering Reinforced Concrete Chimney during Directional Demolition Blasting
p.1145

Study of the Design Method for The Shape of Charge Curve of the Double Focusing Warhead
p.1152

Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit
p.1158

The Two-Way Cartridge Valves in the Synchronization Hydraulic System of Simulation Research
p.1163

Shafting Vibration Simulation for Hydro Turbine Generating Sets
p.1171

The Comparison of Two Simulation Methods on the Thermal Ablation with Large Blood Vessel
p.1177

A Regulatory Network of G2/M Phase Transition for DNA Damage
p.1182

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 444-445Research on Test Points Selection Using Complex...

Research on Test Points Selection Using Complex Field Fault Modeling in Analog Circuit

Abstract:

In this paper, a new test nodes selection technique based on the complex field fault modeling of analog circuits testability is presented. The function F () by the complex field fault modeling can be used as the fault model, which is applicable to both hard (open or short) and soft (parametric) faults. Therefore, we can obtain the signature curves of the potential fault components by PSPICE and MATLAB. For the testability of fault model, fault-test dependency matrix can be concluded. With the integer-coded fault-wise table method and heuristic graph search algorithm, we can obtain a global minimum node set. The number of potential faults with complex field fault modeling is half compared with the traditional methods and the time complexity of the circuit can be reduced significantly.

You might also be interested in these eBooks

Advances in Computational Modeling and Simulation

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 444-445)

Pages:

1158-1162

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.444-445.1158

Citation:

Cite this paper

Online since:

October 2013

Authors:

Jing Yang, Cheng Lin Yang, Zhen Liu

Keywords:

Complex Field Fault Modeling, Fault Dictionary, Test Points Selection

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] J. A. Starzyk, D. Liu, Z. -H. Liu, D. E. Nelson, J. O. Rutkowski, Entropy-based optimum test nodes selection for the analog fault dictionary techniques, IEEE Trans. Instrum. Meas., vol. 53, no. 3, p.754–761, Jun. (2004).

DOI: 10.1109/tim.2004.827085

Google Scholar

[2] J.W. Bandler and A. Salama, Fault diagnosis of analog circuits, in Proc. IEEE ISCAS, p.1279–1325, (1985).

DOI: 10.1109/proc.1985.13281

Google Scholar

[3] M. Slamani and B. Kaminska, Fault Observability Analysis of Analog Circuits in Frequency Domain, IEEE TRANS, VOL 43, NO. 2, pp.134-139, Feb (1996).

DOI: 10.1109/82.486460

Google Scholar

[4] P. M. Lin and Y. S. Elcherif, Analogue circuits fault dictionary—New approaches and implementation, Int. J. Circuit Theory Appl., vol. 13, no. 2, p.149–172, Apr. (1985).

DOI: 10.1002/cta.4490130205

Google Scholar

[5] Chenglin Yang, Shulin Tian , Bing Long, Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques, IEEE Trans, Vol. 58, NO. 7, July, (2009).

DOI: 10.1109/tim.2008.2006725

Google Scholar