The Finite Element Simulation of Surface Wrinkling of Rigid Films on a Compliant Thin-Substrate

Huan Yang Zhou; Qi Xia

doi:10.4028/www.scientific.net/AMM.446-447.22

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 446-447The Finite Element Simulation of Surface Wrinkling...

The Finite Element Simulation of Surface Wrinkling of Rigid Films on a Compliant Thin-Substrate

Abstract:

Subject to a compressive membrane force, a film bonded to a compliant substrate often forms wrinkles. In the past, the studies of such wrinkles are mostly based on the assumption of semi-infinite substrate. However, such an assumption cannot be satisfied in real applications. This paper focuses on wrinkling of a rigid film on a compliant thin-substrate. The finite element method used to analyze wrinkling and investigate the relationship between the critical wavelength, material parameters (such as film Youngs modulus, substrate Poisson's ratio) and geometric parameters (such as substrate thickness). Meanwhile, the finite element results are compared with analytical results.