Operating Temperature Analysis of LED with Cylindrical Cu Slug

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Abstract:

High power light emitting diodes is the new era of lighting due to momentous supremacy in terms of lighting efficacy over traditional lighting systems. The reliability of LED is dependent on its junction temperature. This study confers on the thermal and stress characterization of LED chip with copper cylindrical heat slug through simulation method. The simulation characterization was carried out with Ansys version 11 at ambient temperature of 25°C under natural convection condition. The LED package was powered with input powers of 0.1 W, 0.5 W and 1W .Results indicated that input power influences the junction temperature and stress of LED chip.

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145-148

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January 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] K. Sung Ki, Analysis on Thermal Management Schemes of LED Backlight Units for Liquid Crystal Displays, Components, Packaging and Manufacturing Technology, IEEE Transactions on, vol. 2, pp.1838-1846, (2012).

DOI: 10.1109/tcpmt.2012.2212901

Google Scholar

[2] M. Y. Tsai, C. H. Chen, and C. S. Kang, Thermal measurements and analyses of low-cost high-power LED packages and their modules, Microelectronics Reliability, vol. 52, pp.845-854, (2012).

DOI: 10.1016/j.microrel.2011.04.008

Google Scholar

[3] J.C. Shyu, K.W. Hsu, K.S. Yang, and C.C. Wang, Thermal characterization of shrouded plate fin array on an LED backlight panel, Applied Thermal Engineering, vol. 31, pp.2909-2915, (2011).

DOI: 10.1016/j.applthermaleng.2011.05.019

Google Scholar

[4] T. Ming-Yi, C. Chun-Hung, and T. Wan-Lin, Thermal Resistance and Reliability of High-Power LED Packages Under WHTOL and Thermal Shock Tests, Components and Packaging Technologies, IEEE Transactions on, vol. 33, pp.738-746, (2010).

DOI: 10.1109/tcapt.2010.2065805

Google Scholar

[5] W. Jun, Z. Meilin, L. Shuzhi, Y. Weiqiao, and Z. Jianhua, Study on the application of thermal interface materials for integration of HP-LEDs, in CPMT Symposium Japan, 2010 IEEE, 2010, pp.1-5.

DOI: 10.1109/cpmtsympj.2010.5680285

Google Scholar

[6] Z. Sauli, V. Retnasamy, R. Vairavan, R. C. Ismail, N. Khalid, M. F. C. Husin, and H. Kamarudin, Stress and Temperature Simulation Using Copper-Diamond Composite Slug, in Computer Modelling and Simulation (UKSim), 2013 UKSim 15th International Conference on, 2013, pp.299-303.

DOI: 10.1109/uksim.2013.151

Google Scholar

[7] Z. Sauli, V. Retnasamy, R. Vairavan, W. M. W. N. Haimi, H. Kamarudin, Y. Neoh Fung, and N. Khalid, Solid State Lighting Stress and Junction Temperature Evaluation on Operating Power, in Computer Modelling and Simulation (UKSim), 2013 UKSim 15th International Conference on, 2013, pp.290-293.

DOI: 10.1109/uksim.2013.127

Google Scholar

[8] M. W. Shin and S. H. Jang, Thermal analysis of high power LED packages under the alternating current operation, Solid-State Electronics, vol. 68, pp.48-50, (2012).

DOI: 10.1016/j.sse.2011.10.033

Google Scholar