The Research of IC Test Based on LTX-77 Test System

Li Tan; Yu Fang

doi:10.4028/www.scientific.net/AMM.496-500.1176

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 496-500The Research of IC Test Based on LTX-77 Test...

The Research of IC Test Based on LTX-77 Test System

Abstract:

LTX-77 test system is a large IC test system that is used for various kinds of analog IC, digital IC and analog digital mixed IC. It can be used to test DC parameters, AC parameters and logic functions. In the paper, the IC test platform is LTX-77 test system. IC ADC0804 was tested as the test object. The test method of IC is described in the view of actual test. The test results show that the test system is convenient and accurate, which has important practical value for IC manufacturers and users.

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Periodical:

Applied Mechanics and Materials (Volumes 496-500)

Pages:

1176-1179

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.496-500.1176

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Online since:

January 2014

Authors:

Li Tan, Yu Fang

Keywords:

ADC0804, IC Test, LTX-77

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