Forward Reflection Characteristics of Typical Smooth Building Walls and the Simulation Analysis

Abstract:

Non-line-of-sight optical imaging technology is a novel application of imaging technology developed recently, achieving the effective imaging of the corner, basements and other scenes which are difficult to be directly observed by traditional vision with intermediate reflective surface. Smooth building walls, such as tiles and marbles, are typical intermediate reflective surfaces. Because reflecting surface is neither ideal specular reflective nor Lambertian reflective, the reflection characteristics of the intermediate reflective surface have a significant impact on the non-line-of-sight imaging. Based on the test data of the spectral bidirectional reflectance distribution function (BRDF) of common smooth tiles, the surface transfer function and angle spread function of smooth tiles are established according to the Harvey-Shack surface scatter theory in the paper. And the descriptions of the characteristics of specular reflection and forward scattering are implemented. Furthermore, according to the measured BRDF data at a certain wavelength for a certain angle of incidence, we can predict the reflection and scattering distribution at any other wavelengths or for other incident angles. The simulation results indicate that the curves fitted by the model basically are in agreement with the measured data, so that the simulation of the specular reflection and the forward scattering in the model is valid.

• Periodical: Applied Mechanics and Materials (Volumes 513-517)
• Pages: 3601-3606
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.513-517.3601
• Online since: February 2014
• Authors: Shen You Zhao*, Kai Da Xu, Su Qiu, Wei Qi Jin, Hui Guo, Xia Wang, Kai Jia Jin
• Keywords: Bidirectional Reflectance Distribution Function, Diffuse Reflection, Forward Scattering, Harvey-Shack Surface Scatter Theory, Intermediate Reflective Surface, Specular Reflection

References

[1] Endre Repasi, Peter Lutzmann, et al. Advanced short- wavelength infrared range-gated imaging for ground applications in mono-static and bi-static configurations [J], Applied Optics, 2009, 48(31).

DOI: 10.1364/ao.48.005956

[2] S. O. Rice, Reflection of electromagnetic waves from slightly rough surfaces [J], Commun. Pure Appl. Math. 4, 351(1951).

DOI: 10.1002/cpa.3160040206

[3] P. Beckmann and A. Spizzichino, The Scattering of Electromagnetic Waves from Rough Surfaces [J], Pergamon Press, New York (1963).

[4] J. E. Harvey, Surface scatter phenomena: a linear, shift-invariant process [J], in Scatter from Optical Components, J. C. Stover, Ed., Proc. SPIE1165, 87–99(1989).

DOI: 10.1117/12.962839

[5] James E. Harvey, Light-scattering Characteristics of Optical Surfaces [J], SPIE Vol. 107 Stray Light Problems in Optical Systems (1977).

DOI: 10.1117/12.964594

[6] A. Krywonos, Predicting surface scatter using a linear systems formulation of non-paraxial scalar diffraction [D], University of Central Florida, (2006).

[7] James E. Harvey, Parametric analysis of the effect of scattered light upon the modulation transfer function [J], Optical Engineering 52(7), 073110 (July 2013).

DOI: 10.1117/1.oe.52.7.073110

[8] James E. Harvey, Edward C. Moran, and William P. Zmek, Transfer function characterization of grazing incidence optical systems [J], SPIE Vol. 830 Grazing Incidence Optics for Astronomical and Laboratory Applications (1987).

DOI: 10.1117/12.942159

[9] F.E. Nicodemus, Reflectance Nomenclature and Directional Reflectance and Emissivity [J], Appl. Opt. 9, 1474-5 (1970).

DOI: 10.1364/ao.9.001474