The Test Equipment Based on Single Chip Micro (SCM) of Volt-Ampere Characteristic of CT

Abstract:

Nowadays, various test equipment tend to be more intelligent, the test equipment of the volt-ampere characteristic of CT is so too. As the development of the electronics, VLSI(SCM) is manufactured. The purpose of our project is to scheme out a intelligent test system by the computer technique and the test technique. This equipment is mostly made of the SCM system and the peripheral equipment. We control the output of the digital transformer by SCM. The output voltage can make the TL494 create PWM wave. The wave is the control signal of the main circuit. The output wave of the main circuit is the sine wave, and the value of the output can be amended automatically. Compared with the traditional equipment, this equipment is smaller and use less energy, but its function is more powerful. It can be programmable. We can take it more expediently. So, this kind of equipment can be used widely in the future.

• Periodical: Applied Mechanics and Materials (Volumes 556-562)
• Pages: 1726-1729
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.556-562.1726
• Online since: May 2014
• Authors: Bai Fen Liu*, Ying Gao
• Keywords: Electric Power, Electronics Technique, Intelligent Equipment, SCM

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