[1]
J. M. Rabaey, A. Chandrakasan, and B. Nicolic, Digital Integrated Circuits: A Design Perspective, 2nd ed. Upper Saddle River, NJ: Prentice-Hall, (2003).
Google Scholar
[2]
L. Wang, R. Krishnamurthy, K. Soumyanath, and N. Shanbhag, An energy-efficient leakage-tolerant dynamic circuit technique, in Proc. Int. ASIC/SoC Conf., 2000, p.221–225.
DOI: 10.1109/asic.2000.880705
Google Scholar
[3]
Jinhui wang, Na Gurng, Gang Liu, Shuquin Genq and Wuchen wu, Performance analysis of Dual Vt Domino Circuits with P-V-T variations, in Journal of Applied Mechanics and Materials Vols 89-89, pp.326-330, (2011).
Google Scholar
[4]
H. Mahmoodi and K. Roy, Diode-footed domino: A leakage-tolerant high fan-in dynamic circuit design style, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 51, no. 3, p.495–503, Mar. (2004).
DOI: 10.1109/tcsi.2004.823665
Google Scholar
[5]
A. Alvandpour, R. Krishnamurthy, K. Sourrty, and S. Y. Borkar, A sub-130-nm conditional-keeper technique, IEEE J. Solid-State Circuits, vol. 37, no. 5, p.633–638, May (2002).
DOI: 10.1109/4.997857
Google Scholar
[6]
M. H. Anis, M. W. Allam, and M. I. Elmasry, Energy-efficient noise-tolerant dynamic styles for scaled-down CMOS and MTCMOS technologies, IEEE Trans. Very Large Scale (VLSI) Syst., vol. 10, no. 2, p.71–78, Apr. (2002).
DOI: 10.1109/92.994977
Google Scholar
[7]
Y. Lih, N. Tzartzanis, and W. W. Walker, A leakage current replica keeper for dynamic circuits, IEEE J. Solid-State Circuits, vol. 42, no. 1, p.48–55, Jan. (2007).
DOI: 10.1109/jssc.2006.885051
Google Scholar
[8]
A. Peiravi and M. Asyaei, Robust low leakage controlled keeper by current-comparison domino for wide fan-in gates, integration, VLSI J., vol. 45, no. 1, p.22–32, (2012).
DOI: 10.1016/j.vlsi.2011.07.002
Google Scholar
[9]
H. Suzuki, C. H. Kim, and K. Roy, Fast tag comparator using diode partitioned domino for 64-bit microprocessors, IEEE Trans. Circuits Syst., vol. 54, no. 2, p.322–328, Feb. (2007).
DOI: 10.1109/tcsi.2006.885998
Google Scholar
[10]
K. Bowman, S. G. Duval, and J. D. Meindl, Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for giga scale integration, " IEEE J. Solid State Circuits, vol. 37, no. 2, p.183–190, Feb. (2002).
DOI: 10.1109/4.982424
Google Scholar
[11]
H. F. Dadgour and K. Banerjee, A novel variation-tolerant keeper architecture for high-performance low-power wide fan-in dynamic or gates, IEEE Trans. Very Large Scale (VLSI) Syst., vol. 18, no. 11, p.1567–1577, Nov. (2010).
DOI: 10.1109/tvlsi.2009.2025591
Google Scholar
[12]
C. H. Kim, K. Roy, S. Hsu, R. Krishnamurthy, and S. Borkar, A process variation compensating technique with an on-die leakage current sensor for nanometer scale dynamic circuits, IEEE Trans. Very Large Scale (VLSI) Syst., vol. 14, no. 6, p.646–649, Jun. (2006).
DOI: 10.1109/tvlsi.2006.878226
Google Scholar
[13]
R. G. David Jeyasingh, N. Bhat, and B. Amrutur, Adaptive keeper design for dynamic logic circuits using rate sensing technique, IEEE Trans. Very Large Scale (VLSI) Syst., vol. 19, no. 2, p.295–304, Feb. (2011).
DOI: 10.1109/tvlsi.2009.2031650
Google Scholar
[14]
K. Roy, S. Mukhopadhyay, and H. Mahmoodi-Meimand, Leakage current mechanisms and leakage reduction techniques in deep sub micrometer CMOS circuits, Proc. IEEE, vol. 91, no. 2, p.305–327, Feb. (2003).
DOI: 10.1109/jproc.2002.808156
Google Scholar
[15]
N. Shanbhag, K. Soumyanath, and S. Martin, Reliable low-power design in the presence of deep submicron noise, in Proc. ISLPED, 2000, p.295–302.
DOI: 10.1109/lpe.2000.155302
Google Scholar
[16]
M. Alioto, G. Palumbo, and M. Pennisi, Understanding the effect of process variations on the delay of static and domino logic, IEEE Trans. Very Large Scale (VLSI) Syst., vol. 18, no. 5, p.697–710, May (2010).
DOI: 10.1109/tvlsi.2009.2015455
Google Scholar
[17]
H. Mostafa, M. Anis, and M. Elmasry, Novel timing yield improvement circuits for high-performance low-power wide fan-in dynamic OR gates, IEEE Trans. Circuits Syst. I, Reg. Papers, vol. 58, no. 10, p.1785–1797, Aug. (2011).
DOI: 10.1109/tcsi.2011.2107171
Google Scholar
[18]
Ali Peiravi and Mohammad Asyaei, Current Comparison-Based Domino: New Low-Leakage High-Speed Domino Circuit for Wide Fan-In Gates, IEEE transactions on very large scale integration (VLSI) systems, VOL. 21, NO. 5, MAY (2013).
DOI: 10.1109/tvlsi.2012.2202408
Google Scholar
[19]
Predictive Technology Model (PTM). 16 nm High Performance V2. 1 Technology of PTM Model. (2012, Feb. 19) [Online]. Available at: http: /www. eas. asu. edu/∼ptm.
Google Scholar