A Test-Suite Reduction Approach for Improving Path-Based Fault-Localization Effectiveness

Dan Dan Gong; Xiao Hong Su; Tian Tian Wang; Pei Jun Ma

doi:10.4028/www.scientific.net/AMM.577.1022

Paper Titles

An Improved Frequency Offset Cancellation for Uplink Multi-User OFDMA System Based on TF-RLS Algorithm
p.1004

Design and Implementation of a Stereoscopic Video Player for a Time-Division Display
p.1008

Modelling Peterson Mutual Exclusion Algorithm in DVE Language and Verifying LTL Properties
p.1012

Study on the Resource Scheduling Algorithm for LTE-Advanced Downlink Systems
p.1017

A Test-Suite Reduction Approach for Improving Path-Based Fault-Localization Effectiveness
p.1022

A Metadata Management Mechanism Based on HDFS
p.1026

Analysis and Evaluation of HEVC
p.1030

Automotive ECU Software Design Based on AUTOSAR
p.1034

Implementation of Shading Techniques Based on OpenGL
p.1038

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 577A Test-Suite Reduction Approach for Improving...

A Test-Suite Reduction Approach for Improving Path-Based Fault-Localization Effectiveness

Abstract:

Path-based fault-localization technique is proved to be more effective than coverage-based fault localization because of analyzing the semantics of a program. Most previous work focused on investigating coverage-based test-suite reduction approach for fault localization. But it is not suitable for path-based fault localization, because it only analyzes coverage information, and does not take the execution path information of test cases into account. In this paper, we propose a test-suite reduction approach for path-based fault localization. This approach analyzes the concrete execution path of test cases. The experimental results show that the proposed method works well in improving the effectiveness of path-based fault localization.

You might also be interested in these eBooks

Applied Decisions in Area of Mechanical Engineering and Industrial Manufacturing

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volume 577)

Pages:

1022-1025

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.577.1022

Citation:

Cite this paper

Online since:

July 2014

Authors:

Dan Dan Gong*, Xiao Hong Su, Tian Tian Wang, Pei Jun Ma

Keywords:

Fault Localization, Statistical Analysis, Test-Suite Reduction

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

* - Corresponding Author

References

[1] E. Alves, M. Gligoric, V. Jagannath, and M. Amorim, in: ACM International Conference on Automated Software Engineering, edited by IEEE Computer Society, (2011), pp.520-523.

Google Scholar

[2] P. Daniel and K. Y. Sim, in: International Journal of Software Engineering and Its Applications, edited by Journal of Software Engineering, Vol. 5 (2013), pp.403-412.

Google Scholar

[3] M. Feng, R. Gupta. In: Proceedings of the 9th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering. (2010), pp.81-88.

DOI: 10.1145/1806672.1806688

Google Scholar

[4] G.K. Baah, A. Podguiski, M.J. Harrold. IEEE Transactions on Software Engineering. Vol. 36 (2010), pp.528-545.

Google Scholar

[5] X. Zhang, Q. Gu, X. Chen, J. Qi, D. Chen. In: Proceedings of the 2010 ACM Symposium on Applied Computing. (2010), pp.2229-2236.

Google Scholar

[6] D. Hao and Y. Pan. In: IEEE/ACM international Conference on Automated software engineering, USA. (2005), pp.291-294.

Google Scholar

[7] Y. Yu, J.A. Jones, M.J. Harrold. In: Proceedings of the 30th international conference on Software engineering. (2008), pp.201-210.

Google Scholar