Examination of the Electrolytic Polishing Metal Probe for the Cell Trap by an Electric Field

Yuji Sekido; Kozo Taguchi

doi:10.4028/www.scientific.net/AMM.595.56

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 595Examination of the Electrolytic Polishing Metal...

Examination of the Electrolytic Polishing Metal Probe for the Cell Trap by an Electric Field

Abstract:

Generally, the metal probe for NSOM (Near field scanning optical microscopy) or STM (Scanning Tunneling Microscope) was made with gold or tungsten. However, they were not suitable for the cell trap in our research for the reasons of cost, hardness, etc. In our research, these problems were solved by choosing brass as a material of a probe. Since the probe production by electrolytic polishing can change the shape of the top, tip angle, and taper length etc, we can propose a probe suitable for a cell trap. Therefore, in this examination, we propose the brass probe by electrolytic polishing with low cost and sufficient hardness for cell trap.

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Periodical:

Applied Mechanics and Materials (Volume 595)

Pages:

56-60

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.595.56

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Online since:

July 2014

Authors:

Yuji Sekido*, Kozo Taguchi

Keywords:

Dielectrophoresis, Fusion, Optical Tweezers, Protoplast

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