The Test Investigation and Design Improvements of Voltage Regulator Performance

Yong Zong; Xia Xiao; Rui Zhu

doi:10.4028/www.scientific.net/AMM.701-702.1181

Paper Titles

Research and Application of Transmission Line Differentiated Operation and Maintenance Scheduling Optimization Model
p.1162

Research on Bidirectional DC/DC Converter for Electric Vehicle
p.1169

Some the Application of the Taylor Series for the Analysis of Processes in Non-Linear Resistive Circuits
p.1173

The Effect of Thermal Resistans on I_C-V_BE Fly-Back Characteristic of Power SiGe Heterojunction Bipolar Transistor
p.1177

The Test Investigation and Design Improvements of Voltage Regulator Performance
p.1181

A New Trip Fault of Transmission Line Caused by Lightning Striking to Ground Wire and Conductor Simultaneously
p.1187

Research on Fault Identification Technology of Jumper Windage Yaw Flashover
p.1194

Experimental Circuit Design on Electromagnetic Actuator for Vehicle Active Suspension
p.1201

Research on Multi-Purpose Alarm System for Dormitory Based on AVR
p.1205

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 701-702The Test Investigation and Design Improvements of...

The Test Investigation and Design Improvements of Voltage Regulator Performance

Abstract:

Voltage regulator is designed to automatically maintain the constant of regular voltage level. Every automotive IC has its own regulator module for analog and logic circuit power supply. The output load regulation and current consumption are directly related to the IC’s performance, or even the whole application module. The performance of regulator is not only related with the output parameters, but also the protection character. The over voltage protection feature guarantees the IC’s working environment within specific voltage input range. This article use one IDC’s (Intelligent Distribution Controller) regulator module to describe the design theory for regulator over voltage performance improvement. The test investigation and verification on ATE (Automatic Test Equipment) are demonstrated. The parameter of over voltage threshold is optimized obviously by 2% yield increasing.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 701-702)

Pages:

1181-1186

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.701-702.1181

Citation:

Cite this paper

Online since:

December 2014

Authors:

Yong Zong*, Xia Xiao, Rui Zhu

Keywords:

ATE, Design Improving, IDC, Voltage Regulator

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

* - Corresponding Author

References

[1] Moreno Lizaranzu MJ, Cuesta F. Improving electronic sensor reliability by robust outlier screening., Sensors (Basel). 2013 Oct 9.

DOI: 10.3390/s131013521

Google Scholar

[2] P.N. Variyam and Abhijit Chatterjee, Enhancing test effectiveness for analog circuits using synthesized measurements, Proc. VLSI Test Symposium, 1998, pp.132-137.

DOI: 10.1109/vtest.1998.670860

Google Scholar

[3] S. Wu et, al. Statistical Analysis and Optimization of Parametric Delay Test, ITC, (2007).

Google Scholar

[4] AEC (Automotive Electronics Council) Q004 Proposed Draft: Zero Defects Guideline http: /www. aecouncil. com/AECDocuments. html.

Google Scholar

[5] AEC (Automotive Electronics Council) Q100: Stress Qualification For Integrated Circuits. http: /www. aecouncil. com/AECDocuments. html.

Google Scholar

[6] Oleg Erlich, Carol and Dave Dowding. Common Tools Development from a STIL Based API/Object Model, IEEE International Workshop on Open Source Test Technology Tools, (2006).

Google Scholar

[7] K. Killpack, et al., Analysis of Causation of Speed Failures in a Microprocessor: A Case Study, IEEE Design & Test Special Issue on Silicon Debug and Diagnosis (2008).

Google Scholar

[8] P Muhtaroglu et al, I/O self-leakage test, Int. Test Conference, (2004).

Google Scholar