Overall Solution of Comprehensive Evaluation for Missile Storage Life

Abstract:

From the urgent needs of storage life evaluation in missile storage management, combining the characteristics of long-term use of missile and characteristics of different level products of the system, a complete set of overall solution of the life prediction and life extension of missile was proposed. First, through the use of missiles long-term use historical information, the reliability function model of the missile storage was established, and the life conclusions of missiles were estimated. Secondly, by conducting accelerated life or accelerated degradation test of missile, the life of missile was estimated. And by conducting environmental test and simulation test, the environmental adaptability indexes were verified. Thirdly, by carrying out the life feature detection analysis of the circuit board, the microscopic defects in the circuit board were detected, and the guidance for life extension work was raised. Finally, by conducting accelerated degradation of the key components and materials, the life conclusions of them were estimated. Combining the storage life information of missiles, board-level circuits, components and materials, a complete set of overall solution of the life prediction and life extension of missile was proposed.

• Periodical: Applied Mechanics and Materials (Volume 724)
• Pages: 307-311
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.724.307
• Online since: January 2015
• Authors: Jun Gao, Dao Ping Huang*, Xiao Bing Li
• Keywords: Accelerated Test, Missile, Storage Reliability

References

[1] Hou Xijiu: J. Quality and Reliability, Vol. 04 (1997), pp.44-46.

[2] Zhou Kun, Luo Tianyuan, Zhang Lunwu: J. Equipment Environmental Engineering, Vol. 12 (2005), pp.6-11.

[3] Li Jiuxiang: J. Quality and Reliability, Vol. 04 (2004), pp.14-17.

[4] Sun Liang, Xu Tingxue, Dai Ying: J. Tactical Missile Technology, Vol. 04 (2004), pp.16-19.

[5] Zhuang Xiying, Meng Jianxin: J. Aero Weaponry, Vol. 06 (2008), pp.59-62.

[6] Ruan Jinyuan, Ruan Xin: J. Reporting of Standardization, Vol. 01 (2000), pp.7-11.

[7] Mei Denghua, Pan Guomei: J. Acta Automat Sinica, Vol. 28 (2002), pp.1034-1038.

[8] Zhang Zhihua: J. Chinese Journal of Applied Probability and Statistics, Vol. 01 (1995), pp.82-87.