Effects of Layer Thickness on the Microstructures of TiN/AlTiN Multilayer Coatings

Kamil J. Kadhim; Nizam Abd Rahman; Mohd Rizal Salleh; Khairul Izani Mohd Zukee

doi:10.4028/www.scientific.net/AMM.761.417

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 761Effects of Layer Thickness on the Microstructures...

Effects of Layer Thickness on the Microstructures of TiN/AlTiN Multilayer Coatings

Abstract:

TiN/AlTiN multilayer coatings were deposited on tungsten carbide cutting tool by applying a direct current on a pulsed bias arc ion plating system. The effect of pulsed bias layer thickness on sample properties was investigated. The amount of grain size decreased with increasing layer thickness. The crystal structure of the coatings was determined using a D8 Advance Bruker X-ray diffractometer with CuKa (λ = 1.5405 Å) radiation. TiN/AlTiN multilayer coatings were crystallized with orientations in the (111), (200), (222), and (311) crystallographic planes, and the microstructure was enhanced with preferred orientation in the (111) plane. Compared with the substrate, all the specimens coated with TiN/AlTiN multilayer coatings exhibited better X-ray diffraction properties.

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Periodical:

Applied Mechanics and Materials (Volume 761)

Pages:

417-420

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.761.417

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Online since:

May 2015

Authors:

Kamil J. Kadhim*, Nizam Abd Rahman, Mohd Rizal Salleh, Khairul Izani Mohd Zukee

Keywords:

Arc Ion Plating, Layer Thickness, Ti/AlTiN Multilayer Coatings, XRD

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