Terahertz Signal Measurement on a Chiral Metamaterial Using Terahertz Emission Spectroscopy

Juliasih Partini; Kamsul Abraha; Arief Hermanto; Satoshi Tomita; Matsui Takahiro

doi:10.4028/www.scientific.net/AMM.771.125

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 771Terahertz Signal Measurement on a Chiral...

Terahertz Signal Measurement on a Chiral Metamaterial Using Terahertz Emission Spectroscopy

Abstract:

Terahertz Signal generated from chiral metamaterial due to the second order non-linear process has been observed. Chiral metamaterial used in this research have a periodic square pattern with different depth on a silver film and was fabricated by Focused Ion Beam System. Terahertz emission spectroscopy has been conducted using two amplified 100 fs laser pulses with a central wavelength of 800 nm. The emission will emerge due to an optical rectification process as a result of an intense femtosecond laser pulses radiation on a chiral metamaterial sample. The measurement result clearly shows that the terahertz signal is emitted at 2 THz frequency and sufficiently fit with a square of laser power, which is consistent with an expected optical rectification process.

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Periodical:

Applied Mechanics and Materials (Volume 771)

Pages:

125-128

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.771.125

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Online since:

July 2015

Authors:

Juliasih Partini*, Kamsul Abraha, Arief Hermanto, Satoshi Tomita, Matsui Takahiro

Keywords:

Chiral Metamaterial, Emission Spectroscopy, Optical Rectification, Terahertz Signal

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