Characterization of the Thin Films Structures in Subwavelength Regime as Biosensing Materials

Abstract:

Zinc oxide nanostructured materials, such as films and nanoparticles, could provide a suitable platform for development of high performance biosensing material due to their unique fundamental material properties. This paper presents the characterization of ZnO thin film as biosensing material by metallic strip grating structure (MSG), for the real-time detection. In this work, high quality ZnO films were grown on ITO/glass substrates by vacuum thermal evaporation method. We characterized by X-ray diffraction (XRD) the film crystalline quality and by scanning electron microscopy (SEM) the film morphology.

• Periodical: Applied Mechanics and Materials (Volume 772)
• Pages: 62-66
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.772.62
• Online since: July 2015
• Authors: R. Steigmann*, N. Iftimie, A. Savin
• Keywords: Biosensing Applications, Characterization, Subwavelength Regime, Thin Films ZnO

References

[1] D.P. Norton, Y.W. Heo, M.P. Ivill, S.J. Pearton, M.F. Chisholm and T. Steiner, Mater. Today, Vol. 7 (2004), p.34–40.

DOI: 10.1016/s1369-7021(04)00287-1

[2] X.W. Sun and H.S. Kwok, J. Appl. Phys., Vol. 86 (1999), p.408–411.

[3] K.H. Yoon, J.W. Choi and D.H. Lee, Thin Solid Films, Vol. 302 (1997), pp.116-121.

[4] A.P. Rambu, D. Sirbu, N. Iftimie and G.I. Rusu, Thin Solid Films, Vol. 520, No. 4 (2011), pp.1303-1307.

DOI: 10.1016/j.tsf.2011.04.158

[5] A.P. Rambu, V. Tiron, V. Nica and N. Iftimie, J. Appl. Phys., Vol. 113: 234506 (2013).

[6] Y.E. Lee, J.B. Lee, Y.J. Kim, H.K. Yang, J.C. Park and H.J. Kim, J. Vac. Sci. Technol. A 14, 1943 (1996).

[7] Z.R.R. Tian, J.A. Voigt, J. Liu, B. Mckenzie and M.J. Mcdermott, J. Am. Chem. Soc., Vol. 124 (2002), p.12954–12955.

[8] J.B. Pendry, A.J. Holden, W.J. Stewart and I. Youngs, Phys. Rev. Lett., Vol. 76 (1996), pp.4773-4776.

DOI: 10.1103/physrevlett.76.4773

[9] A. Savin, R. Steigmann and A. Bruma, Sensors, Vol. 14 (2014), pp.11786-11804.

DOI: 10.3390/s140711786

[10] M. Born and E. Wolf: Principle of Optics, 5th ed, Pergamon, Oxford, (1975).

[11] J.A. Kong, Electromagnetic wave theory, EMW, Cambridge, MA, (2000).

[12] K.S. Kunz and R.J. Luebbers: The Finite Difference Time Domain Method for Electromagnetics, Boca Raton, FL: CRC Press, (1993).

[13] R. Grimberg, A. Savin and R. Steigmann, NDT&E International, Vol. 46 (2012), pp.70-76.

[14] R. Grimberg, Mater. Sci. Eng. B, Vol. 178 (2013), pp.1285-1295.

[15] A. Lagendijk, B. Van Tiggelen and D.S. Wiersma, Physics Today, (2009), pp.24-29.

[16] A. Savin, R. Steigmann, patent RO129801-A0 , (2014).

[17] R. Grimberg, A. Savin, E. Radu and O. Mihalache, IEEE Transactions on Magnetics, Vol. 36(1) (2000), pp.299-307.

[18] R. Grimberg, A. Savin, R. Steigmann, B. Serghiac, A. Bruma, INSIGHT, (2011), Vol. 53(3) (2011), pp.132-137.

DOI: 10.1784/insi.2011.53.3.132