Effect of Thickness of Porphyrin on Electrical Properties of Organic Devices

Abstract:

The study on electrical properties for both 2,3,7,8,12,13,17,18-octaethyl-21,23H-porphine Cu (II) (Cu-porphyrin) and 2,3,7,8,12,13,17,18-octaethyl-21,23H-porphine (porphyrin) thin film, which were fabricated using spin coating method was conducted. Porphyrins were diluted with chloroform of various concentrations (0.05 mg/ml, 0.1 mg/ml, 0.5 mg/ml, 2.0 mg/ml and 3.0 mg/ml). The solution was spin coated on top of glass substrates. A layer of aluminum was evaporated on top of the organic thin film through thermal evaporation and shadow mask was placed on top of the organic thin film where two electrodes with a gap of 50 μm were formed. Surface morphology of the organic thin film was observed by scanning electron microscope (SEM) and profilometer. Different concentrations of organic solutions greatly affected the molecular packing and arrangement order of the organic thin film and thickness of the organic layer and eventually affected electrical properties of the devices.

• Periodical: Advanced Materials Research (Volume 1024)
• Pages: 381-384
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1024.381
• Online since: August 2014
• Authors: Pi Lin Tan, Guan Yeow Yeap, Wen Shyang Chow, Rupert Schreiner, Kuan Yew Cheong*
• Keywords: Electrical Properties, Porphyrin, Spin Coating

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