ZrO2 Thin Films Prepared by Self-Assembled Method

Abstract:

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Octadecyltrichlorosilane (OTS) was prepared on glass substrate to form self-assembled monolayer (OTS-SAM). The OTS-SAM was then UV-irradiated to endow the film with good chemisorption ability. Zirconia films were formed on silanol SAM by the LPD method. The phase structure and surface configuration of the zirconia films were studied by XRD and SEM respectively. The XRD results indicate that the as-deposited ZrO2 thin films are pure tetragonal phase after being annealed at 500°C for 1 h. SEM images show the zirconia film is uniform, but not very compacted.

Info:

Periodical:

Advanced Materials Research (Volumes 105-106)

Edited by:

Wei Pan and Jianghong Gong

Pages:

485-487

DOI:

10.4028/www.scientific.net/AMR.105-106.485

Citation:

A. Xia et al., "ZrO2 Thin Films Prepared by Self-Assembled Method", Advanced Materials Research, Vols. 105-106, pp. 485-487, 2010

Online since:

April 2010

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Price:

$35.00

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