An Adjustable Inertia Balance Support for High-Speed Scanning Probe Microscope

Abstract:

An adjustable inertia balance support is proposed to counterbalance the inertial force from the actuators for high performance scanning probe microscope. The adjusting method is based on voltage proportion control. In contrast with traditional method that adding or removing mass, it is very convenient to adjust to minimize the inertial force transmitted to the supporting base. It may have a promising application on the current inertia balance support structure, which is used in some high-speed scanning probe microscope. What is more, it has a very good compatibility with current structure.

• Periodical: Advanced Materials Research (Volumes 1061-1062)
• Pages: 735-738
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1061-1062.735
• Online since: December 2014
• Authors: Gang Yi Yan*
• Keywords: High-Speed Scanner, Inertia Balance Support, Scanning Probe Microscope

References

[1] T. Ando, High-speed atomic force microscopy coming of age, Nanotechnology, vol. 23, no. 6, p.062001, Feb 17, (2012).

DOI: 10.1088/0957-4484/23/6/062001

[2] T. Ando, T. Uchihashi, and T. Fukuma, High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes, Progress in Surface Science, vol. 83, no. 7-9, pp.337-437, (2008).

DOI: 10.1016/j.progsurf.2008.09.001

[3] C. Gerber, and H. P. Lang, How the doors to the nanoworld were opened, Nature nanotechnology, vol. 1, no. 1, pp.3-5, (2006).

DOI: 10.1038/nnano.2006.70

[4] Y. Yong, and S. Mohemani, Design of an Inertially Counterbalanced Z-Nanopositioner for High-Speed Atomic Force Microscopy, IEEE TRANSACTIONS ON NANOTECHNOLOGY, vol. 12, no. 2, p.137, (2013).

DOI: 10.1109/tnano.2012.2233749

[5] Y. K. Yong, S. O. Moheimani, B. J. Kenton et al., Invited review article: high-speed flexure-guided nanopositioning: mechanical design and control issues, Rev Sci Instrum, vol. 83, no. 12, p.121101, Dec, (2012).

DOI: 10.1063/1.4765048

[6] B. J. Kenton, and K. K. Leang, Design and control of a three-axis serial-kinematic high-bandwidth nanopositioner, Mechatronics, IEEE/ASME Transactions on, vol. 17, no. 2, pp.356-369, (2012).

DOI: 10.1109/tmech.2011.2105499

[7] B. J. Kenton, A. J. Fleming, and K. K. Leang, Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed, Rev Sci Instrum, vol. 82, no. 12, p.123703, Dec, (2011).

DOI: 10.1063/1.3664613

[8] A. J. Fleming, B. J. Kenton, and K. K. Leang, Bridging the gap between conventional and video-speed scanning probe microscopes, Ultramicroscopy, vol. 110, no. 9, pp.1205-14, Aug, (2010).

DOI: 10.1016/j.ultramic.2010.04.016

[9] T. Fukuma, Y. Okazaki, N. Kodera et al., High resonance frequency force microscope scanner using inertia balance support, Applied Physics Letters, vol. 92, no. 24, p.243119, (2008).

DOI: 10.1063/1.2951594

[10] G. E. Fantner, G. Schitter, J. H. Kindt et al., Components for high speed atomic force microscopy, Ultramicroscopy, vol. 106, no. 8-9, pp.881-7, Jun-Jul, (2006).

DOI: 10.1016/j.ultramic.2006.01.015

[11] T. Ando, N. Kodera, D. Maruyama et al., A High-Speed Atomic Force Microscope for Studying Biological Macromolecules in Action, Japanese Journal of Applied Physics, vol. 41, no. Part 1, No. 7B, pp.4851-4856, (2002).

DOI: 10.1143/jjap.41.4851

[12] T. Ando, N. Kodera, E. Takai et al., A high-speed atomic force microscope for studying biological macromolecules, Proc Natl Acad Sci U S A, vol. 98, no. 22, pp.12468-72, Oct 23, (2001).

DOI: 10.1073/pnas.211400898