An Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices

A.S. Bakerenkov

doi:10.4028/www.scientific.net/AMR.1083.211

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An Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices
p.211

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1083An Automatic Equipment for Measure of Electrical...

An Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices

Abstract:

An automatic equipment for measurement of voltage-current characteristic of semiconductor devices was described. The technique for precision voltage setting, which enables to obtain ±1mV accuracy in ±10V range, was described. Logarithmic current sensors were used for measurements of the current and calibration technique of the sensors was presented. It provides relative accuracy 1% in wide current range (0,1nA..10mA).

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Periodical:

Advanced Materials Research (Volume 1083)

Pages:

211-216

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1083.211

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Online since:

January 2015

Authors:

A.S. Bakerenkov*

Keywords:

Current Sensor, Integrated Circuits, Measuring Systems, Nanoelectronic Devices, Semiconductor, Voltage-Current Characteristic

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* - Corresponding Author

References

[1] A.S. Bakerenkov, V.V. Belykov, V.V. Shurenkov, A.M. Nikitin, V.S. Pershenkov, N.V. Varlamov, System for the measurement of operation amplifiers in radiation hardness testing, Sensors and systems (ISSN 1992-7185), № 6, pp.25-29, (2011).

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[2] V.S. Pershenkov, A.S. Bakerenkov, S.A. Varlamov, V.V. Belykov, V.A. Lapshiskiy, Bipolar devices radiation hardness estimate technique and conversion model using, Nuclear science issues (ISSN 1997-2830), vol. 4, pp.5-12, (2011).

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[3] A.S. Bakerenkov, V.V. Belykov, N.V. Varlamov, A.M. Nikitin, V.S. Pershenkov, V.V. Shurenkov, E.S. Volkodaev. T.S. Ermolenko, Temperature control system for integrated circuits hard ions radiation testing, Nuclear physics and engineering (ISSN 2079-5629), vol. 2, №6, pp.502-509, (2011).

Google Scholar