Simultaneous Observation of Nanocrystalline BaTiO3 Ceramics Surface Morphology and Ferroelectricity Using Scanning Nonlinear Dielectric Microscopy

Article Preview

Abstract:

A scanning nonlinear dielectric microscopy (SNDM) with an additional electrically conducting atomic force microscope cantilever as a probe needle is adopted to simultaneously observe the surface topographic and domain images of nanocrystalline BaTiO3 ceramics with super-high resolution. The sample exhibits a uniform grain size distribution and the average grain sizes are calculated to be about 30 nm. Some regions are brighter than the others in SNDM image, indicating the existence of ferroelectric domains structure. In addition, P-E hysteresis and piezoresponse loops are found in nanocrystalline BaTiO3 ceramics. The experimental results demonstrate that the SNDM with the function of atomic force microscopy is very useful for understanding domain structures of nanocrystalline ferroelectric materials.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 146-147)

Pages:

1252-1255

Citation:

Online since:

October 2010

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2011 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Scott JF, Science Vol. 315 (2007), p.954.

Google Scholar

[2] Cho Y, Kirihara A and Saeki T, Rev Sci Instrum Vol. 67 (1996), p.2297.

Google Scholar

[3] Cho Y, Atsumi S and Nakamura K, Jpn J Appl Phys Part 1 Vol. 36 (1997), p.3152.

Google Scholar

[4] Cho Y, Kazuta S, Matsuura K, Appl Phys Lett Vol. 75 (1999), p.2833.

Google Scholar

[5] Fujimoto K and Cho Y, Jpn J Appl Phys Part 1 Vol. 43 (2004), p.2818.

Google Scholar

[6] Cho Y, Hashimoto S and Odagawa N, Appl Phys Lett Vol. 87 (2005), p.232907.

Google Scholar

[7] Xiao C J, Jin C Q and Wang X H, Mater Chem Phys Vol. 111 (2008), p.209.

Google Scholar

[8] Zhao Z, Buscaglia V and Viviani M, Phys Rev B Vol. 70 (2004), p.024107.

Google Scholar

[9] Wang X H, Deng X Y and Wen H, Appl Phys Lett Vol. 89 (2006), p.62902.

Google Scholar