[1]
R. Vilar, Journal of Laser Applications Vol. 11 (1999), p.64.
Google Scholar
[2]
Noyan I.C. et al., Crit. Rev. Solid State Mater. Sci. Vol. 20 (1995), p.125.
Google Scholar
[3]
M.E. Fitzpatrick, A. Lodini: Analysis of residual stress by diffraction using neutron and synchrotron radiation and evaluation (Taylor and Francis, London and New York 2003).
DOI: 10.1201/9780203608999
Google Scholar
[4]
R.A. Owen et al., Mat. Sci. and Engineering vol. A346 (2003), p.159.
Google Scholar
[5]
H.F. Poulsen: Three dimensional X-ray diffraction microscopy (Springer-Verlag, Berlin Heildelberg 2004).
Google Scholar
[6]
E.M. Lauridsen et al., J. Appl. Cryst. Vol. 34 (2001), p.744.
Google Scholar
[7]
L. Margulies et al., Acta Mater. Vol. 50 (2002), p.1771.
Google Scholar
[8]
H.W. Press et al.: Numerical recipes in FORTRAN (Cambridge University Press, 1992).
Google Scholar
[9]
U. de Oliveira, V. Ocelík, J. Th. M. De Hosson, Surface Science and Technology (2006), in press.
Google Scholar