Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition

Abstract:

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Define the course of getting mean envelope as an operation (mean envelope operation) in Empirical mode decomposition (EMD), so as to express the Intrinsic Mode Function (IMF) with mean envelopes. Summarize several rules of the mean envelope operation. On this fundamental, the abnormal components exist in the over-sifting IMFs are extracted out, and the conclusion is testified with the infinite sifting experiment.

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Periodical:

Edited by:

Dehuai Zeng

Pages:

377-382

DOI:

10.4028/www.scientific.net/AMR.159.377

Citation:

G. T. Ge "Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition", Advanced Materials Research, Vol. 159, pp. 377-382, 2011

Online since:

December 2010

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$35.00

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