Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition

Guang Tao Ge

doi:10.4028/www.scientific.net/AMR.159.377

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 159Over-Sifting Components Analysis in Bidimensional...

Over-Sifting Components Analysis in Bidimensional Empirical Mode Decomposition

Abstract:

Define the course of getting mean envelope as an operation (mean envelope operation) in Empirical mode decomposition (EMD), so as to express the Intrinsic Mode Function (IMF) with mean envelopes. Summarize several rules of the mean envelope operation. On this fundamental, the abnormal components exist in the over-sifting IMFs are extracted out, and the conclusion is testified with the infinite sifting experiment.

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Periodical:

Advanced Materials Research (Volume 159)

Pages:

377-382

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.159.377

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Online since:

December 2010

Authors:

Guang Tao Ge

Keywords:

Bidimensional Empirical Mode Decomposition, Infinite Sifting, Mean Envelope Operation, Over-Sifting

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