Research on Noise Sources in CMOS Image Sensors

Bao Yuan Han; Yuan Yuan Shang; Xiao Xu Zhao; Hui Liu

doi:10.4028/www.scientific.net/AMR.159.527

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 159Research on Noise Sources in CMOS Image Sensors

Research on Noise Sources in CMOS Image Sensors

Abstract:

CMOS (Complementary Metal Oxide Semiconductor) imagers as a solid state array develop rapidly. This article introduces various types of CMOS image sensors’ noises in detail, the cause of each noise, as well as a brief overview of current methods for reducing different noise.

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Periodical:

Advanced Materials Research (Volume 159)

Pages:

527-531

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.159.527

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Online since:

December 2010

Authors:

Bao Yuan Han, Yuan Yuan Shang, Xiao Xu Zhao, Hui Liu

Keywords:

CCD, CMOS APS, CMOS PPS, Noise, Sensor

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