Development of Electronic Real-Time Inspecting System for Raw Silk Based on FPGA

Xin Liu; Wei Zhu Wei; Qing Guan Chen

doi:10.4028/www.scientific.net/AMR.175-176.460

Paper Titles

Research on the Grading Theory of Thick and Thin Defects in the Electronic Testing for Raw Silk
p.439

Study on Evaluation of Woven Garment Stitch Crack
p.445

Development and Performance Study of Microstrip Patch Textile Antenna
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Effects of Clothing Structural Factors on Electromagnetic Radiation Protection
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Development of Electronic Real-Time Inspecting System for Raw Silk Based on FPGA
p.460

Flame Retardation of Plain Weave Fabrics Made of Polyacrylonitrile Pre-Oxidized Yarns
p.465

Study on Effect Factors of Filtrating Properties of the Polypropylene and Basalt Filament Woven Filter Cloth
p.469

Investigation of Movable Balloon Controller System on a Ring Spinning Frame
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Wear Comfort Evaluation of Pearl-Cellulose Fabrics
p.480

HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 175-176Development of Electronic Real-Time Inspecting...

Development of Electronic Real-Time Inspecting System for Raw Silk Based on FPGA

Abstract:

Traditional seriplane testing method has been used to detect the evenness and defects of raw silk for a long time, the results of which are affected subjectively by the examiner to a certain extent and are controversial. In this paper, improved based on SD-1 size tester of raw silk, built-in FPGA chip and 9004 real-time controller and winding machine are used to develop a fast real-time inspecting system for evenness, cleanness and neatness of raw silk. This can resolve the problems of the independent intellectual property rights of sensors and process software troubling electronic inspection of raw silk, and realize the conversion, acquisition, real-time differentiation, results display and storage of continuous dynamic voltage signal of raw silk. Compared with the same type device, this system has a higher processing efficiency and better results objectivity.

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Periodical:

Advanced Materials Research (Volumes 175-176)

Pages:

460-464

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.175-176.460

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Online since:

January 2011

Authors:

Xin Liu, Wei Zhu Wei, Qing Guan Chen

Keywords:

Electronic Inspecting System, Field-Programmable Gate Array (FPGA), Raw Silk, Silk Defects, Silk Evenness

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References

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