Research on the Grading Theory of Thick and Thin Defects in the Electronic Testing for Raw Silk

Abstract:

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Based on the sampling and grading theory of raw silk test, this paper studied the grading theory method of thick and thin defects of the raw silk in the electronic testing. By means of analyzing the data obtained from the raw silk electronic detector, the fact that the thick and thin defects of the raw silk appropriately take negative binomial distribution in the electronic testing has been confirmed. Under such circumstance, the distribution of the average of the sampling samples of the thick and thin defects was given, and fitting on the relationship between the mean and variance of the thick and thin defects were carried out by introducing Taylor’s power law equation, thus the right grading rate and probability of the difference between two spot tests about the thick and thin defects of the raw silk in the electronic testing was deduced. Moreover, the conclusion of the theoretical analysis was confirmed by simulation tests. The results might provide a basis for establishing the grading standards of the thick and thin defects in the electronic testing for raw silk.

Info:

Periodical:

Advanced Materials Research (Volumes 175-176)

Main Theme:

Edited by:

Lun Bai and Guo-Qiang Chen

Pages:

439-444

DOI:

10.4028/www.scientific.net/AMR.175-176.439

Citation:

J. T. Niu et al., "Research on the Grading Theory of Thick and Thin Defects in the Electronic Testing for Raw Silk", Advanced Materials Research, Vols. 175-176, pp. 439-444, 2011

Online since:

January 2011

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Price:

$35.00

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