Analysis on Photoelectric Method of Measuring the Fineness of Raw Silk
In order to precisely measure the fineness of raw silk, some features of raw silk are analyzed. By use of Fresnel principle, diffractions caused by raw silk in different conditions are analyzed and simulated. Image data of the fineness of raw silk measured by CMOS image sensor is analyzed for obtaining precise result. Finally, some suggestions are proposed for photoelectric measuring the fineness of raw silk.
Lun Bai and Guo-Qiang Chen
W. C. Fei et al., "Analysis on Photoelectric Method of Measuring the Fineness of Raw Silk", Advanced Materials Research, Vols. 175-176, pp. 565-569, 2011