Analysis of the Nanoscale Manipulation Using Near-Field Optical Tweezers Combined with AFM Probe

Bing Hui Liu; Li Jun Yang; J. Tang; Yang Wang; Ju Long Yuan

doi:10.4028/www.scientific.net/AMR.188.184

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 188Analysis of the Nanoscale Manipulation Using...

Analysis of the Nanoscale Manipulation Using Near-Field Optical Tweezers Combined with AFM Probe

Abstract:

In recent years, optical manipulators based on forces exerted by enhanced evanescent field close to near-field optical probes have provided the access to nonintrusive manipulation of nanometric particles. However, the manipulation capability is restricted to the intensity enhancement of the probe tip due to low emitting efficiency. Here a near-field optical trapping scheme using the combination of an optical fiber probe and an AFM metallic probe is developed theoretically. Calculations are made to analyze the field distributions including tip interaction and the trapping forces in the near-field region by applying a direct calculation of Maxwell stress tensor using three-dimensional FDTD. The results show that the scheme is able to trap particle at the nanoscale with lower laser intensity than that required by conventional near-field optical tweezers.

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Periodical:

Advanced Materials Research (Volume 188)

Pages:

184-189

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.188.184

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Online since:

March 2011

Authors:

Bing Hui Liu, Li Jun Yang, J. Tang, Yang Wang, Ju Long Yuan

Keywords:

Field Enhancement, Maxwell Stress Tensor, Near-Field Optical Tweezer, Three-Dimensional FDTD, Trapping Force

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