Spreading Resistance Analysis of LED by Structure Function

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Abstract:

In this paper, an investigation on structure function of LED for thermal resistance testing is presented. LED was placed on aluminum plate in different locations. Four group experiments were applied to determine thermal resistance of LED. A simple and effective solution is proposed and discussed on the spreading resistance. The experimental results show the relationship between junction temperature and different locations.

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Periodical:

Advanced Materials Research (Volumes 199-200)

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1501-1504

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Online since:

February 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] Yenshu Chen: Investigations of the Thermal Spreading Effects of Rectangular Conduction Plates and Vapor Chamber. Vol. 129 (2007) , p.349.

Google Scholar

[2] Lan kim and Moo Whan Shin: Thermal resistance Measurement of LED Package with Multichip. IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, Vol. 30 (2007), p.632.

DOI: 10.1109/tcapt.2007.906332

Google Scholar

[3] Seri Lee: Constriction/Spreading resistance model for electronics package. Vol. 4 (1995), p.199.

Google Scholar

[4] Hyun-Ho Kim and Sang-Hyun Choi: Microelectronics Reliability 48(2008), p.449.

Google Scholar

[5] V. Székely and Tran Van Bien: Fine structure of heat flow path in semiconductor devices: a measurement and identification method, Solid-State Electronics, V. 31, pp.1363-1368 (1988).

DOI: 10.1016/0038-1101(88)90099-8

Google Scholar